IR SOURCES THERMAL VACUUM CYCLING CHARACTERIZATION

Posted by Alejandro López Moya
On February 11, 2022
0

Thermal Vacuum Testing is necessary to be carried out because the environmental conditions in the space are extreme, the combination of low pressure and extreme temperatures can cause the failure of a component. That is why in Alter Technology, we test the components in similar conditions.

Optoelectronics, TESTING

Lasers Endurance Characterization in Vacuum Conditions – Test Setup

Posted by Alejandro López Moya
On January 25, 2022
0

Laser diodes characterization can be hard due to the laser’s nature. In the case of lasers, perfect control of current and temperature applied is mandatory. In addition, a good heat dissipation must be provided to avoid lasers being damaged. Special and complex equipment is required for a perfect characterization because accuracy is a must with thi

Optoelectronics, TESTING

Calibration Sources in Vacuum Conditions

Posted by Alejandro López Moya
On January 13, 2022
0

Our Optoelectronics department knows how to fulfill this need. One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.

Optoelectronics Components Testing

Calibration sources characterization in vacuum conditions

Posted by Alejandro López Moya
On September 23, 2021
0

One of our customers requested that we carry a thermal cycling test at extreme temperatures (between 93ºC and -178ºC) over some VIS-NIR calibration sources (five samples at a time). At the same time, these sources were tested in vacuum conditions, and electro-optical characterization at different temperatures during cycling was requested.

Optoelectronics Components Testing

IR sources thermal vacuum cycling characterization

Posted by Alejandro López Moya
On July 19, 2021
0

Every time a component is tested in extreme temperature conditions, it becomes a challenge to design a reliable test setup. If in addition, components must be in vacuum conditions and electro-optical characterization is required at different temperatures, complexity increases exponentially.

Optoelectronics Components Testing

Lasers endurance characterization in vacuum conditions

Posted by Alejandro López Moya
On July 6, 2021
0

Laser diodes characterization can be complex due to the laser’s nature. A good heat dissipation must be provided to avoid lasers being damaged. Unique and challenging equipment is required for a perfect characterization because accuracy is a must with this optical component. The real challenge? The test setup definition and implementation when lasers must be tested in extreme conditions, like vacuum or high/low temperatures.

ALTER Laboratory Services, Optoelectronics Components Testing

Lot Acceptance Test (LAT)

Posted by Alejandro López Moya
On June 28, 2021
0

A Lot Acceptance Test (LAT) is a reduced set of Qualification tests over components or equipment, required to accept a specific manufacturing lot for its use. A LAT sequence allows customers to have complete traceability of the components they are going to use in their application, starting from the wafer used during manufacturing.

EEE Components, PASSIVES

Single Event Latchup Protection Circuits

Posted by Alejandro López Moya
On June 14, 2020
0

Single event effects (SEE’s) are one of the most common problems that electronic devices, mainly CMOS and bipolar integrated circuits, must fight when they are used in space applications.