Very Extreme temperature Testing Examples

Example of parts characterization (I): Optical & Electrical parameters

All optical & electrical parameters of different  families  of electronic components (Electro-optical, ASIC, RF, Discrete components, passive parts, new materials, etc…) can been characterized to asses usability of parts under such environment.

Example of parts characterization (II): Characterization of SiC JFET & MOSFET

Key Testing parameters:

• Temperature characterization: SiC -> T>150ºC
• High Voltage (up to 1700V) plus high temperature testing (175ºC)
• High Power Tests: 17A Devices

Example of parts characterization (III): Prototyping and Characterisation of Radiation Hardened SIC MOS Structures

• Understand full failure mechanism of SiC technologies regarding manufacturing processes
• Consolidate best design and manufacturing approach for future parts development

Key elements

• Full characterization of several foundries as well as oxidation processes, packaging approach, etc…
• To consolidate test methods and associated standards for SiC characterization

Example of parts characterization (IV): Photonic parts in Mars exploration related programmes

Mars Atmosphere

• Temperature Range (-135ºC to +70ºC)
• Optical setup characterization:
  • Thermopiles (for non-contact Temp measurement)
  • UV Photodiodes (200nm – 400nm)