IR sources thermal vacuum cycling characterization
- Posted by Alejandro López Moya
- On July 19, 2021
- 0
Thermal conductivity: the most challenging point to achieve
Every time a component is tested in extreme temperature conditions, it becomes challenging to design a reliable test setup. If, in addition, components must be in vacuum conditions and electro-optical characterization is required at different temperatures, complexity increases exponentially.
In this document, we will talk about thermal conductivity, how we achieve, within the framework of Qualification tests, a really low temperature.
Test Engineer in Innovation and New Technologies Department at Alter Technology Tüv Nord
Alejandro López Moya has a Degree in Electronics Engineering from the University of Jaén.
After ending his studies in 2010, Alejandro started to work as a Test engineer, where he has accumulated more than 10 years of experience. He has developed a career focused on the design/development/execution of test systems for the most leading technology sectors like Aerospace, Aeronautics, and Automotive.
Since he joined Alter Technology in June 2016 as part of the Optoelectronics and New Technologies Department, Alejandro has been in charge of developing complex electronics designs based on FPGA/uP for Image sensors and mixed-signal ICs testing. Still, at the same time, he has been responsible for test setup development and test execution for all kinds of optoelectronics components. Within his framework, he is currently qualifying components for ESA projects like JUICE.
After ending his studies in 2010, Alejandro started to work as a Test engineer, where he has accumulated more than 10 years of experience. He has developed a career focused on the design/development/execution of test systems for the most leading technology sectors like Aerospace, Aeronautics, and Automotive.
Since he joined Alter Technology in June 2016 as part of the Optoelectronics and New Technologies Department, Alejandro has been in charge of developing complex electronics designs based on FPGA/uP for Image sensors and mixed-signal ICs testing. Still, at the same time, he has been responsible for test setup development and test execution for all kinds of optoelectronics components. Within his framework, he is currently qualifying components for ESA projects like JUICE.
Latest posts by Alejandro López Moya (see all)
- IR SOURCES THERMAL VACUUM CYCLING CHARACTERIZATION - February 11, 2022
- Lasers Endurance Characterization in Vacuum Conditions – Test Setup - January 25, 2022
- Calibration Sources in Vacuum Conditions - January 13, 2022
0 comments on IR sources thermal vacuum cycling characterization