Electrical characterization at 500ºC for GRACE project
- Posted by Juan Moreno Echarri
- On August 26, 2021
- 0
ALTER has developed a test setup capable of electrically characterize the radiation sensors at temperatures of 500°C and higher.
Within the framework of the Graphene-enhanced RAdiation detector on Silicon Carbide for harsh Environments (GRACE) project, Alter Optoelectronics laboratory in Madrid, Spain, has developed a test setup capable of electrically characterize the radiation sensors at temperatures of 500°C and higher.
Optoelectronics and Innovation department at Alter Technology
Juan Moreno has a bachelor’s degree in physics and since 2010 works in the Optoelectronics and Innovation department of Alter Technology. In charge of the BepiColombo/SolO SiC blocking diodes as a test engineer for years. Currently responsible of radiation tolerance improving of SiC modules and SiC plastic modules testing. Nowadays, he is the technical contact point for the SiC diodes development in Alter Technology.
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