When and What to do in an Electrical Test

Electrical Test – Characterization

For passive devices testing, we have equipment which permits the characterization of the electrical behavior of resistors, capacitors, coils, etc., in a wide range of test conditions and in accordance with their applicable specifications.

• Measurement and testing of high power devices
• Dielectric withstanding voltage up to 12 KV
• Characterization on LCR devices up to 3 GHz

A global testing offer from wafers, singulated dies, packages up to modules

Electrical Measurements

Our capabilities:

Active devices testing: discrete (diodes and TRT) through standard linear and digital components to VLSI

• Semiconductor curve tracer
• Semiconductor analyser
• VLSI tester for verification of the static and dynamic functional parameters
• Mixed-signal ATE (Teradyne UltraFLEX)
• Extreme temperature testing (-80ºC to +200ºC)

• Design and manufacturing of multilayer boards (up to 16 layers)
• Small bias current measurement (fA)
• Measurement of high speed and precision converters A/D & D/A up to 24 bits
• Measurement of +1000 I/O digital devices
• Mixed -ignal ASIC measurement
• Measurement of high precision oscillators with low phase noise
• Device testing up to 100 Vdc
• Device testing up to 140 A

• Power characterization of RF/MW devices
• Screening and Life testing of RF/MW devices
• Test fixture design and manufacturing for RF/MW devices
• Design and manufacturing of customized calibration kits for high frequency devices
• Design and manufacturing of RF boards with precise impedance adjustment
• Design and manufacturing of fixed circuit impedance adaptors
• Dynamic impedance adaptation using RF tuners
• Signal noise measurement of high frequency devices
• Characterization of RF/MW multiport devices