Very Extreme temperature Testing Examples
- Posted by doEEEt Media Group
- On February 20, 2020
- 0
Example of parts characterization (I): Optical & Electrical parameters
All optical & electrical parameters of different families of electronic components (Electro-optical, ASIC, RF, Discrete components, passive parts, new materials, etc…) can been characterized to asses usability of parts under such environment.
Example of parts characterization (II): Characterization of SiC JFET & MOSFET
Key Testing parameters:
- Temperature characterization: SiC -> T>150ºC
- High Voltage (up to 1700V) plus high temperature testing (175ºC)
- High Power Tests: 17A Devices
Example of parts characterization (III): Prototyping and Characterisation of Radiation Hardened SIC MOS Structures
- Understand full failure mechanism of SiC technologies regarding manufacturing processes
- Consolidate best design and manufacturing approach for future parts development
Key elements
- Full characterization of several foundries as well as oxidation processes, packaging approach, etc…
- To consolidate test methods and associated standards for SiC characterization
Example of parts characterization (IV): Photonic parts in Mars exploration related programmes
Mars Atmosphere
- Temperature Range (-135ºC to +70ºC)
- Optical setup characterization:
- Thermopiles (for non-contact Temp measurement)
- UV Photodiodes (200nm – 400nm)
Environmental Tests:
- Temp range: -135ºC to +105ºC
- Radiation neutrons, gamma, protons, etc..
- Life Test to simulate the day-night cycles
- 600 cycles -130ºC to +15ºC (Winter cycles)
- 1410 cycles -105ºC to + 40ºC (Summer cycles)
- Full characterization of UV Photodiodes
- From -135ºC to + 105ºC with steps of 10ºC
- Linearity
- Angle of Incidence variation
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