COTS Wear Out Test for 15 years in Space use

ABSTRACT

COTS EEE is intended to be used on long-term missions in space applications for up to 15 years or more.
One key question is, what is the Wear Out behaviour for EEE COTS intended to be used on such a long mission?

The proposed presentation reports on an activity performed under the OSIP scheme of ESA and dealing with the “COTS Wear Out Test for 15 years in Space use”.
Representative families/technologies are chosen, 50 pieces for each part type ( 25p in oven 1, 25p in oven 2). Dedicated long-term “life tests” are evaluated: “Wear Out” estimation is performed on Integrated Circuits and Discrete active (Diodes and transistors) and passive (resistors, capacitors).
Six-part types have been chosen to perform “stress test,” monitoring in the 2 conditions during 6500 Hours, biased

• 1 in temperature stress test (1.2 max ambient Rated temp °C)
• 1 in voltage stress test (1.2 max voltage)
• detection in case of an electrical defect

There are intermediate and final tests for each component (~300 parts measurement)@ 0H, 1000H, 2000H, 4000H and 6500H, with fine parametrical drifts detection.
At the end of the “life test” duration (~6500H), those components’ estimated lifetime duration will be compared to an objective of 15 Years in Space.

At the time of ACCEDE workshop, 4000H will already be performed; Presentation will be done on stress test conditions and on the first results (drift during Tests and Readouts).

Speaker: Nathalie Jaussein – Thales Alenia Space

After a few years working in a Semiconductor site in the south of France as a Product Engineer for Flash memories, Nathalie Jaussein joined a failure analysis laboratory in Bordeaux for a long period and then 4 years in situ as an EEE Quality engineer subcontractor at CNES Toulouse. She is now working at Thales Alenia Space Toulouse in the EEE Quality department and has specific activities in Nanosatellites and Constellation applications.