COTS selection and tests at Microchip France to support use in space applications

ABSTRACT

From a wide range of industrial and automotive semiconductors available at Microchip, this presentation will cover the A&D product line in France to enable new COTS-type solutions for use in space applications.

From product selection to final qualification, Microchip will share methodology, process, and tools used for radiations assessment, radiations tests, and end plastic device qualification to bring COTS device at the space level

This presentation is planned to be done by our radiations engineering team located in Nantes, France.

Speaker: Guillaume Bourg Cazan – Microchip

Guillaume received his Electronic master’s degree by 2000 from the ESIGELEC (Electronic School of Engineers) of Rouen, France. He worked in Semiconductor for more than 15 years, working for ATMEL, and now MICROCHIP in different functions from Automotive industrialization Product Engineering to Aerospace and Defense radiation test expert. He started on 8-bit Microcontrollers (AVR). He joined the European Aerospace & Defense Group in Microchip in 2009 as FPGA and Nonvolatile memories product engineer. Then in 2012 he takes in charge the radiation testing for most of the Radiation Tolerant and Rad Hardened by Design products like Microcontrollers, SRAM, Non-Volatile memories, and power devices. He is now responsible of the radiation testing group in Microchip Aerospace and Defense group who is in charge of developing the in-house radiation test solution, the Single Effects Events test and external reporting against Heavy ions, protons and Neutrons.