Abstract:                   

Radiation Hardness Assurance (RHA) performed according to the standards (e.g. [1]) is associated with considerable costs and requires an extensive effort in time. These constraints – that are always coming together with a sound RHA analysis – constitute a severe limit for low cost missions that simply cannot afford to use qualified components and/or to follow a full RHA approach of the used parts. Likewise, the use of Commercial Off-The-Shelf (COTS) components becomes more and more of interest, especially for small satellite missions like CubeSats. Seibersdorf Laboratories is coordinating and carry out together with the University Padua the CORHA study on radiation screening of COTS components and verification of COTS radiation hardness assurance approach. In the course of this study we will evaluate the radiation sensitivity of COTS components with respect to total ionizing dose (TID) and single event effects (SEE), as applicable to the component under study.

The TID parameter degradation will be investigated for a predefined set of relevant electrical parameters. The SEE phenomena of concern for each specific DUT will be identified and proper testing of these will be foreseen in the test plans. Following this strategy we will provide a comprehensive set of radiation data relevant for RHA on a widespread set of COTS parts that are of interest to ESA, the European space industry and small satellites missions.

The obtained data set will serve (1) as a base for a proposal of an ad-hoc RHA approach for COTS components and (2) to investigate the adequacy of simulation tools for proton or heavy ion upset rate calculations such as PROFIT [2], SIMPA [3] and Figure of Merit (FOM) [4]. The presentation will provide an overview and current status of the CORHA project.

References:

[1] ECSS-Q-ST-60-15C, Radiation Hardness Assurance – EEE Components, ECSS, Oct 2012

[2] Calvel et. al., An empirical model for predicting proton upset rate, IEEE Transaction on Nuclear Science, Vol. 43(6), December 1996

[3] Doucin et. al., Model of single event upsets induced by space protons in electronic devices, in Proc. RADECS Conference 1995, pp. 402 – 408

[4] Petersen, The SEU Figure of Merit and proton upset rate calculations, IEEE Transaction on Nuclear Science, Vol. 45(6), December 1998