Changes to SMDs 5962-12227 and 5962-13207 of MAGNETORESISTIVE RAMs (MRAM)
- Posted by Manuel Padial Pérez
- On September 29, 2019
- 0
Device type variants 03 and 04 of SMDs 5962-12227 and 5962-13207, directly replace the variants 01 and 02, respectively, whose current status becomes End of Life (EOL).
In addition to the wafer hot probe operation, device type variants 03 and 04 include cold (-40ºC) wafer probe as part of production flow, as well.
Quality levels ready to be shipped are QML Q (device type variant 03) and QML Q+ (device type variant 04).
So far, QML V quality level is not currently available from an approved source of supply.
Device type variant 04 provide QML Q product with additional testing (so called QML Q+) as specified in paragraph 4.2.1d of SMDs 5962-12227 and 5962-13207:
- 100% internal visual, Test Method 2010 condition A of MIL-STD-883.
- 100% PIND (Single pass).
- Serialization.
- 100% X-ray (Top view only).
- Group A.
- Dynamic burn-in at +125ºC for 240 hours or equivalent, deltas, PDA (3%) for Functional Test only, and PDA (5%) for DC and Functional Test combined.
- Static burn-in I and II (Test Method 1015 of MIL-STD-883).
Lead the Technical Content Maintenance Team of doEEEt platform. at Alter Technology
Manuel Padial has a Degree in Industrial Electronic. Engineering and a Master (M.Eng.)/Advanced Degree in Electrical and Electronic Engineering.
Since 2000 in Alter Technology, as EEE Parts Engineer, first in the Engineering and Materials Management Department, has given technical support to customers in many different space programmes. And later on, as Coordinator of the Parts Engineering and Purchasing Department, has been in charge of guarantee the proper EEE Parts selection/definition/testing to ensure the technical/schedule/budget compliance to projects requirements. Currently and since 2017 is leading the Technical Content Maintenance Team of doEEEt platform.
With the continuous maintenance of the platform technical content, doEEEt provides to the space community the most updated and complete information about Hi-Rel EEE components, related documentation, and reports, as well as any associated procurement and testing activities.
Since 2000 in Alter Technology, as EEE Parts Engineer, first in the Engineering and Materials Management Department, has given technical support to customers in many different space programmes. And later on, as Coordinator of the Parts Engineering and Purchasing Department, has been in charge of guarantee the proper EEE Parts selection/definition/testing to ensure the technical/schedule/budget compliance to projects requirements. Currently and since 2017 is leading the Technical Content Maintenance Team of doEEEt platform.
With the continuous maintenance of the platform technical content, doEEEt provides to the space community the most updated and complete information about Hi-Rel EEE components, related documentation, and reports, as well as any associated procurement and testing activities.
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