Constructional Analysis in Microsection Inspection
- Posted by Mari Carmen López
- On July 23, 2019
- 0
8 lead Flat Pack device (FP8) is metallographic prepared in ALTER materials & processes laboratory, recognized as a recommended facility for such activity by ESA authority (MEMO ESA-TECMSP-MO-013165).
Sample & Method
Cross-section analysis is a very useful way of determining the construction and material composition of electronic devices.
The FP device is potted in epoxy resin. After curing, the sample is sequentially grinded up to reach the plane of interest. Then, the specimen is subjected to several polishing steps to achieve a high-quality surface to be analyzed by a metallographic microscopy.
Remark
An in-depth constructional analysis can provide information about the construction of the device, identifying potential weaknesses or factors that should be improved.
This FP package houses a small semiconducting die, with wire attaching the die to the lead frame. Cross-section analysis, as a part of the constructional analysis, allows us to obtain information about the state of Die attaching, IC bonding, IC encapsulation and the whole internal structure.
Contact us
Head Of Materials and Processes Laboratory
Mari Carmen has a degree in Degree in Chemistry and a PhD. in Materials Science.
She is responsible for the Materials & Process Laboratory of Alter Technology. Her work is focused on investigating the effects of the environment on electrical components, materials, and processes. As the head of the laboratory, she also manages the studies conducted to evaluate the quality of a bare or assembled printed circuit board in relation to ECSS standards or according to the customer’s specifications.
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